EMSINC - 2009 | National Conference on Electron Microscopy and Allied Fields & XXX Annual Meeting of EMSI
17-19 January, 2009
By
Department of Physics, Bundelkhand University, Jhansi
&
Electron Microscope Society of India (EMSI)
Theme
Join the eminent researchers from academia and industry to discuss the latest research development in -
Advances in instrumentation (SEM, TEM and X-ray Microanalysis),
Specimen Preparation techniques,
Scanning and Transmission Electron Microscopy,
Electron Probe and X-ray Probe Microanalysis,
Auger Electron Spectroscopy and Microscopy,
Scanning Probe Microscopy (AFM, STM etc.),
Field Ion and Field Emission Microscopy,
Confocal Microscopy and other Microscopy related areas.
Register by 17 January 2009
Further info about Conference on Electron Microscopy and Allied Fields
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