IITR Hands on Training cum Workshop On “Electron Microscopy-Why, How and What” | October 19 - 23, 2015 ~ helpBIOTECH

04 September 2015

IITR Hands on Training cum Workshop On “Electron Microscopy-Why, How and What” | October 19 - 23, 2015

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Hands on Training cum Workshop On “Electron Microscopy-Why, How and What”

October 19 - 23, 2015

Organized by:

Institute Instrumentation Centre

Indian Institute of Technology Roorkee,

Roorkee-247667, Uttarakhand (India)


AIM AND SCOPE OF THE WORKSHOP: The “Electron Microscopy: Why, how and what” Workshop is organized to provide postgraduate-level students and researchers in Physics, Chemistry and Materials Sciences, with basic knowledge of the capabilities and limitations of Electron Microscopes (FE-SEM and TEM). It will also help the participant in selecting the type of electron microscopy best suited for his/her work. The workshop includes lectures on practical and theoretical aspects of Electron Microscopy given by internationally recognized experts followed by hands-on training sessions. The format and content of the Workshop is tailored to the needs of the practical microscopist routinely dealing with challenges of instrumental procedures, specimen preparation, data collection and quantification, as well as those of research workers keen to obtain a deeper understanding of the Physics underlying the Electron Microscopy, imaging and analysis.

This one-week workshop would focus on understanding the basics of Field-Emission Scanning Electron Microscope (FE-SEM) and Transmission Electron Microscope (TEM). The emphasis would be on operation of FE-SEM, TEM, Diffraction imaging, and sample preparation techniques for TEM and FESEM.

Institute Instrumentation Centre houses two FE-SEM and one TEM. FE-SEMs available at IIC are from Carl-Zeiss and FEI. Both FE-SEM are equipped with various detectors such as SE-Detector, Back Scattered Detector, EDS System, and EBSD System. The FE-SEM from Carl-Zeiss is the latest one with in-line objective lens type configuration giving it better resolution and image quality. IIC also houses state of the art Technai G2 20 S-TWIN Transmission Electron Microscope from FEI. The aforesaid TEM is equipped with SAED and EDS systems.

Practical session includes sample preparation, working on FE-SEM and TEM, image analysis and alignment in TEM. There are several electron microscopes available in India and several research scholars use them routinely. This workshop will help the young researches to make best use of FE-SEM and TEM. The purpose of this workshop is to impart the required basic theory, operation and application of High resolution Electron Microscopy

Workshop Content:

1. Introduction to Electron Microscopy

2. Principle, Instrumentation and Application of Electron Microscopic techniques

3. Sample preparation

4. Energy dispersive spectroscopy (EDS)

5. Interpretation of data

6. Troubleshooting

Brochure :



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